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  Home > JCE Print > Journal of Chemical Education > Issues > 1997  > September  >
Chemical Education Today
Chemistry Behind the News
A Refrigerator Magnet Analog of Scanning-Probe Microscopy
Julie K. Lorenz, Joel A. Olson, Dean J. Campbell, George C. Lisensky, and Arthur B. Ellis
University of Wisconsin-Madison, Department of Chemistry, Madison, WI 53706-1396

Cover
September 1997
Vol. 74 No. 9
p. 1032A
Abstract
Images of individual atoms can be obtained via scanning-probe microscopes. These experimental techniques are leading to breakthroughs in the developement of new materials and are enhancing our understanding of atomic-scale phenomena. They all involve a probe tip terminated in on or just a few atoms. The interaction between the tip and a sample surface is measured as the tip moves (scans) relative to the surface. A property such as electric current or interatomic force is used to measure the strength of the tip-sureface interaction. Examples include Sanning Tunneling Microscopy (STM) and Atomic Force Microscopy (AFM). The activity described on the Student Side of this insert uses the magnetic interactions between a flexible-sheet refrigerator magnet and a probe tip cut from the same magnet as a macroscopic analog of scanning probe microscopies.

See Letter re: this article.
More Information
*  Citation
 Lorenz, Julie K.; Olson, Joel A.; Campbell, Dean J.; Lisensky, George C.; Ellis, Arthur B. J. Chem. Educ. 1997 74 1032A.
*  Keywords
 Teaching/Learning Aids, Surface Science, Materials Science, and Atomic Properties/Structure; Classroom Activity
*  History
 Created:
Last Updated:		 September 28, 2004
June 23, 2005
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