I would have subtitled this book "All You Ever Wanted To Know about ...Sample Preparation". Although its principal thrust is geared towards the analytical chemist in an X-ray diffraction (XRD) or X-ray fluorescence (XRF) service laboratory, this text will be of use primarily as a reference source in all milieus dealing with undergraduate research projects and advanced laboratory courses in physical and analytical chemistry. It contains dozens of suggestions for preparing randomly oriented small samples of nearly anything. For example, rocks and minerals, soft organics and hard ceramics, radioactive and liquid materials, metals and oils are all treated.

As the availability of XRD and XRF equipment has increased, so has the use of these techniques in the teaching schedule. Many undergraduate laboratory and research projects utilizing these methods have been described in the literature and are found in laboratory textbooks. Very often, especially with the increasingly common use of automated computer-controlled instrumentation, sample preparation has become the key experimental technique required for successful data collection. However, it is not always easy to prepare the statistically random distribution of small particles (crystallites) that is required by these methods.

A multitude of techniques have been developed over the past 70 years, but many of them have been handed down by word of mouth or are scattered throughout the literature. This book represents an attempt to systematically describe the theory and practice of sample preparation.

This excellent guide to the intricacies of sample preparation begins with a description of statistical sampling methods and the principles of grinding techniques. After a discussion of XRF specimen preparation, which includes pressing pellets, fusion methods, crucible selection and handling very small samples, detailed descriptions for handling rocks, minerals, cements, metals, oils, and vegetation [sic] are given.

The preparation of XRD samples is described for various diffraction equipment geometries (utilizing both counter and film detectors), including specific information regarding the use of flat specimens and slurries, the use of internal standards, and the effects of crystallite size on the diffraction pattern. Methods for handling ceramics, clays, zeolites, air-sensitive samples, thin films, and plastics are described, along with the special handling requirements for materials to be studied by high-pressure, high-temperature, or low-temperature techniques.

One whole chapter is devoted to the equipment used in specimen preparation, including grinders, pulverizers, presses, specimen holders, repair of platinumware, and sources of all types of special equipment. Did you ever want to know where to get a Plattner steel mortar or a micronizing mill or soft-glass capillary tubes with 0.01-mm wall thickness? It's all here in this monograph.

The book ends with a good glossary of terms, a general bibliography in addition to the extensive list of references following each of its 9 chapters, and an index. It will be of help in many areas of spectroscopy and analytical chemistry, as well as in XRD and XRF analyses.