An interferometric method for monitoring polymerization kinetics is described. The experimental apparatus can be constructed from items commonly available in undergraduate laboratories. It consists of a low power helium-neon laser, a home-built Michelson interferometer, and a photodiode light detector. When a polymerizing sample is placed in one arm of the Michelson interferometer, the variation in refractive index will cause a corresponding shift in the phase of the coherent optical beam that passes through the sample, and the output of the interferometer will subsequently fluctuate between constructive and destructive interference. The oscillation in the interferometer output intensity is monitored as a function of time with the photodiode. The time between successive maxima (or minima) is used to calculate the change in refractive index with time (Dn/Dt), which is subsequently used as a phenomenological definition of polymerization rate. We have utilized this device to collect and compare curing profiles of commercially available epoxy glues.
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