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| Home > JCE Print > Journal of Chemical Education > Issues >
2003
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February
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In the Laboratory
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Atomic Scale Imaging: A Hands-On Scanning Probe Microscopy Laboratory for Undergraduates
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Chuan-Jian Zhong, Li Han, Mathew M. Maye, Jin Luo, Nancy N. Kariuki, and
Wayne E. Jones Jr.
Department of Chemistry and Institute of Materials Research, State University
of New York, Binghamton, NY 13902
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February 2003
Vol. 80 No. 2
p. 194
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| Abstract |
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A new hands-on laboratory experiment using a scanning probe microscope is described for an advanced undergraduate course. The laboratory involves a combination of scanning tunneling microscopy (STM) and atomic force microscopy (AFM) with an emphasis on atomic scale visualization and imaging of both conductive and nonconductive materials. Well-defined crystalline materials, highly-ordered pyrolytic graphite and muscovite mica, are studied using STM and AFM, respectively. Students experience sample preparation, tip preparation, microscope setup, and data acquisition. The images are analyzed and interpreted by determination of atomic spacing, pattern and density, comparison with known crystalline structures, and discussions of tunneling current and tip-sample interactions. Direct student benefits include atomic visualization of concepts and analytical imaging techniques.
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| Supplement |
Additional background material, the experimental procedure, and notes for data processing are available.
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 Contents |
JCE2003p0194W.doc (Microsoft Word)
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| Download |
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| More Information |
Citation |
Zhong, Chuan-Jian; Han, Li; Maye, Mathew M.; Luo, Jin; Kariuki, Nancy N.; Jones, Wayne E., Jr. J. Chem. Educ. 2003 80 194.
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Keywords |
AFM*; Laboratory Instruction; Materials Science; scanning probe microscopy*; STM*; Surface Science; tunneling current*
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History |
Created:
Last Updated: |
January 6, 2003
February 28, 2005
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| Home > JCE Print > Journal of Chemical Education > Issues >
2003
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February
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194
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