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2005
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Symposium: Chemistry at the Nanometer Scale
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Getting Physical with Your Chemistry: Mechanically Investigating Local Structure and Properties of Surfaces with the Atomic Force Microscope
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William F. Heinz
Department of Physiology, John Hopkins School of Medicine, Baltimore, MD 21205
Jan H. Hoh
Department of Chemical Engineering, John Hopkins University, Baltimore, MD 21218; Department of Physiology, John Hopkins School of Medicine, Baltimore, MD 21205
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May 2005
Vol. 82 No. 5
p. 695
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| Abstract |
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The atomic force microscope is an extremely powerful and versatile tool for probing the chemistry, material properties, and dynamics of surfaces and interfaces at the nanometer and picoNewton scale in a sample’s native environment. A description of the main components of current instruments, including cantilevers and their design, is presented, along with the modes of operation, origin of contrast, and factors which contribute to the spatial resolution. Key concepts and best practices related to data acquisition, image interpretation, and force measurement are discussed.
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| More Information |
 Citation |
Heinz, William F.; Hoh, Jan H. J. Chem. Educ. 2005 82 695.
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Keywords |
Intermolecular Forces; Nanotechnology; Surface Science
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History |
Created:
Last Updated: |
March 28, 2005
April 15, 2005
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| Home > JCE Print > Journal of Chemical Education > Issues >
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May
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695
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